日本萬(wàn)用鉗表總匯
日本萬(wàn)用鉗表總匯
型 號 |
CT內徑 |
CT內徑電流測試范圍 |
分辨率 |
備 注 |
漏電電流鉗形表 |
M-100 |
18mmφ |
200A/20A |
0.1mA |
|
M-102 |
23mmφ |
200mA/100A |
0.1mA |
|
M-104 |
33mmφ |
200mA/150A |
0.1mA |
|
M-110 |
30mmφ |
2mA/20mA/60mA |
1μA |
|
M-111 |
30mmφ |
20mA/200mA/60A |
0.01mA |
高頻過(guò)濾遮斷 |
M-140 |
40mmφ |
30mA/300mA/30A/300A |
0.01mA |
|
M-310 |
40mmφ |
30mA/300mA/30A/300A |
0.01mA |
|
M-340 |
40mmφ |
2mA/20mA/60mA |
1μA |
|
MCL400D |
40mmφ |
0.2/2/20/200/400A |
0.1mA |
電壓,電阻測試 |
MCL400DFN |
40mmφ |
20/200mA,2A~400A |
0.01mA |
高頻率過(guò)濾遮斷:電壓,電阻測試 |
MLC400H |
40mmφ |
20/200mA,2A~400A◆ |
0.01mA |
Ig成分測試:高頻過(guò)濾遮斷 |
MLC400RMS |
40mmφ |
40/400mA,4~400A◆ |
0.01mA |
電壓,電阻測試,最大值保留 |
MLC500RMS |
40mmφ |
50/500mA,50~500A◆ |
0.01mA |
電壓,電阻測試,最大值保留 |
MLC400 |
40mmφ |
40/400mA,4/40/400A |
0.01mA |
瞬時(shí),最大,平均值記憶,最大值保留 |
MCM500 |
40mmφ |
50/500mA,5/50/500A |
0.01mA |
MCM400基礎上增加ELB動(dòng)作測試 |
MCL800D |
80mmφ |
200mA,2/20/200/1000A |
0.01mA |
大口徑:記錄數據輸出,最大值保留 |
MCL1100D |
108mmφ |
300mA/3/30/300/3000A |
0.1mA |
大口徑,記錄輸出,高頻濾波 |
|
M-200 |
33mmφ |
20/200A |
0.01A |
接觸形電流測試 |
M-220 |
33mmφ |
20/200A |
0.01A |
|
M-225 |
40mmφ |
200/600A |
0.1A |
超小型,但可測600A |
M-2010 |
40mmφ |
20/200/600A |
0.01A |
電壓,電阻測試 |
M-2100 |
55mmφ |
20/200/2000A |
0.01A |
電壓,電阻,導通,半導體測試功能 |
M-1800 |
80mmφ |
20/200/1800A |
0.01A |
記數據輸出,可長(cháng)時(shí)間測試 |
|
M-230 |
23mmφ |
20/200A |
0.01A |
|
M-240 |
30mmφ |
20/200A |
0.01A |
|
M-250 |
40mmφ |
200A/1000A |
0.1A |
|
M-260 |
55mmφ |
40/400/1000A |
0.01A |
電壓,電阻,頻率,導通,半導體 |
M-270 |
55mmφ |
40/400/1000A◆ |
0.01A |
電壓,電阻,頻率,導通,半導體, |
M-600 |
20mmφ |
200/2000mA/10A◆ |
0.1 |
峰值保持功能 |
|
HCL1000D |
35mmφ |
20/600A |
0.01A |
與絕緣棒配合使用,最大值保留 |
HCL900 |
35mmφ |
20/600A |
0.01A |
記錄數據輸出 |
HCL5000 |
33mmφ |
20/200/500A |
0.01A |
|
HCL8000 |
33mmφ |
20/200A |
0.1A |
|
高次諧波測試用儀表 |
HWT300 |
40mmφ |
400mA,4/40/300A |
0.1mA |
|
HWT301 |
40mmφ |
400mA,4/40/300A |
0.1mA |
|
HWT1000 |
|
|
|
|
HWT2000 |
|
|
|
|
HV SENSOR |
30mmφ |
200A |
|
| |
|